CVE-2024-53017 is a medium-severity memory corruption vulnerability (CVSS 6.6) affecting various Qualcomm Snapdragon and WCN products, including the SDM429W and Snapdragon 429 Mobile Platform. The flaw arises from improper handling of test pattern generator IOCTL commands, potentially leading to low-impact confidentiality and availability, but high-impact integrity compromise. While no active exploitation, public exploit code, or significant community discussion has been observed, its FAUCET Risk Score of 63/100 indicates a notable risk.
| Vendor | Product | Version(s) | CPE |
|---|---|---|---|
Range not provided by sourceCPE matchmatch criteria | cpe:2.3:o:qualcomm:sdm429w_firmware:-:*:*:*:*:*:*:* | ||
Range not provided by sourceCPE matchmatch criteria | cpe:2.3:o:qualcomm:snapdragon_429_mobile_platform_firmware:-:*:*:*:*:*:*:* | ||
Range not provided by sourceCPE matchmatch criteria | cpe:2.3:o:qualcomm:wcn3620_firmware:-:*:*:*:*:*:*:* | ||
Range not provided by sourceCPE matchmatch criteria | cpe:2.3:o:qualcomm:wcn3660b_firmware:-:*:*:*:*:*:*:* |
CVSS version used by this source: 3.1
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
The average CVE in this peer group has 0.0 Twitter, 0.0 Reddit, 0.0 Bluesky, 0.0 Mastodon, and 0.1 GitHub mentions.
No media coverage found for this CVE.
The average CVE in this peer group has 0.1 InfoSec Media, 0.0 Vendor Blog, and 0.0 Security Researcher mentions.
Remediation records are not available for this CVE.